UV-VUV spectroscopic ellipsometry of ternary MgxZn 1-xO (0≤x≤0.53) thin films

R. Schmidt-Grund, M. Schubert, B. Rheinländer, D. Fritsch, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, M. Grundmann

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