Abstract
Optical constants (3000-8000 Å) and layer thicknesses of TiO 2/Ag/TiO2 optical coatings are determined using variable angle of incidence spectroscopic ellipsometry. Ellipsometrically determined silver layer thicknesses agree well with those obtained by cross-sectional transmission electron microscopy. Also, spectral characteristics, absent in bulk silver data, are observed in n and k spectra for the thin silver layers. It is suggested that these structures may be caused by plasmon effects from the silver layers.
Original language | English (US) |
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Pages (from-to) | 3407-3410 |
Number of pages | 4 |
Journal | Journal of Applied Physics |
Volume | 64 |
Issue number | 7 |
DOIs | |
State | Published - 1988 |
ASJC Scopus subject areas
- General Physics and Astronomy