Vector magneto-optical generalized ellipsometry is employed for the determination of the three-dimensional magnetization properties of magnetized thin solid as well as slanted columnar thin film samples. The permalloy thin films were probed by means of Mueller matrix ellipsometry at room-temperature while an external magnetic field was rotated step-wise within each plane of a three-dimensional Cartesian coordinate system (spatial hysteresis loops). Model analysis of the magneto-optical coupling parameter (proportional to the magnetization) confirms the expected uniaxial magnetization shape of the thin solid film and reveals the three-dimensional magneto-optic anisotropy of the nanostructured thin film.
|Original language||English (US)|
|Journal||Applied Physics Letters|
|State||Published - Mar 25 2013|
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)