Vector magneto-optical generalized ellipsometry for sculptured thin films

Daniel Schmidt, Chad Briley, Eva Schubert, Mathias Schubert

Research output: Contribution to journalArticlepeer-review

14 Scopus citations


Vector magneto-optical generalized ellipsometry is employed for the determination of the three-dimensional magnetization properties of magnetized thin solid as well as slanted columnar thin film samples. The permalloy thin films were probed by means of Mueller matrix ellipsometry at room-temperature while an external magnetic field was rotated step-wise within each plane of a three-dimensional Cartesian coordinate system (spatial hysteresis loops). Model analysis of the magneto-optical coupling parameter (proportional to the magnetization) confirms the expected uniaxial magnetization shape of the thin solid film and reveals the three-dimensional magneto-optic anisotropy of the nanostructured thin film.

Original languageEnglish (US)
Article number123109
JournalApplied Physics Letters
Issue number12
StatePublished - Mar 25 2013

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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