Vector magneto-optical generalized ellipsometry for sculptured thin films

Daniel Schmidt; Chad Briley; Eva Schubert; Mathias Schubert

doi:10.1063/1.4799365

Vector magneto-optical generalized ellipsometry for sculptured thin films

Daniel Schmidt, Chad Briley, Eva Schubert, Mathias Schubert

Electrical & Computer Engineering

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Abstract

Vector magneto-optical generalized ellipsometry is employed for the determination of the three-dimensional magnetization properties of magnetized thin solid as well as slanted columnar thin film samples. The permalloy thin films were probed by means of Mueller matrix ellipsometry at room-temperature while an external magnetic field was rotated step-wise within each plane of a three-dimensional Cartesian coordinate system (spatial hysteresis loops). Model analysis of the magneto-optical coupling parameter (proportional to the magnetization) confirms the expected uniaxial magnetization shape of the thin solid film and reveals the three-dimensional magneto-optic anisotropy of the nanostructured thin film.

Original language	English (US)
Article number	123109
Journal	Applied Physics Letters
Volume	102
Issue number	12
DOIs	https://doi.org/10.1063/1.4799365
State	Published - Mar 25 2013

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.4799365

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abstract = "Vector magneto-optical generalized ellipsometry is employed for the determination of the three-dimensional magnetization properties of magnetized thin solid as well as slanted columnar thin film samples. The permalloy thin films were probed by means of Mueller matrix ellipsometry at room-temperature while an external magnetic field was rotated step-wise within each plane of a three-dimensional Cartesian coordinate system (spatial hysteresis loops). Model analysis of the magneto-optical coupling parameter (proportional to the magnetization) confirms the expected uniaxial magnetization shape of the thin solid film and reveals the three-dimensional magneto-optic anisotropy of the nanostructured thin film.",

author = "Daniel Schmidt and Chad Briley and Eva Schubert and Mathias Schubert",

note = "Funding Information: The authors acknowledge financial support from the National Science Foundation in RII (EPS-1004094) and CAREER (ECCS-0846329) and MRSEC (DMR-0820521), the University of Nebraska-Lincoln, and the J.A. Woollam Foundation. D.S. acknowledges support and fruitful discussions with G. Cooney, J.A. Woollam Company, Inc.",

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AU - Schmidt, Daniel

AU - Briley, Chad

AU - Schubert, Eva

AU - Schubert, Mathias

N1 - Funding Information: The authors acknowledge financial support from the National Science Foundation in RII (EPS-1004094) and CAREER (ECCS-0846329) and MRSEC (DMR-0820521), the University of Nebraska-Lincoln, and the J.A. Woollam Foundation. D.S. acknowledges support and fruitful discussions with G. Cooney, J.A. Woollam Company, Inc.

PY - 2013/3/25

Y1 - 2013/3/25

N2 - Vector magneto-optical generalized ellipsometry is employed for the determination of the three-dimensional magnetization properties of magnetized thin solid as well as slanted columnar thin film samples. The permalloy thin films were probed by means of Mueller matrix ellipsometry at room-temperature while an external magnetic field was rotated step-wise within each plane of a three-dimensional Cartesian coordinate system (spatial hysteresis loops). Model analysis of the magneto-optical coupling parameter (proportional to the magnetization) confirms the expected uniaxial magnetization shape of the thin solid film and reveals the three-dimensional magneto-optic anisotropy of the nanostructured thin film.

AB - Vector magneto-optical generalized ellipsometry is employed for the determination of the three-dimensional magnetization properties of magnetized thin solid as well as slanted columnar thin film samples. The permalloy thin films were probed by means of Mueller matrix ellipsometry at room-temperature while an external magnetic field was rotated step-wise within each plane of a three-dimensional Cartesian coordinate system (spatial hysteresis loops). Model analysis of the magneto-optical coupling parameter (proportional to the magnetization) confirms the expected uniaxial magnetization shape of the thin solid film and reveals the three-dimensional magneto-optic anisotropy of the nanostructured thin film.

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Vector magneto-optical generalized ellipsometry for sculptured thin films

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