Video rate Atomic Force Microscopy (AFM) imaging using compressive sensing

Bo Song, Ning Xi, Ruiguo Yang, King Wai Chiu Lai, Chengeng Qu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

21 Scopus citations

Abstract

Atomic Force Microscopy (AFM) is a powerful tool for nano-size imaging. The advantage of AFM is that it can get extraordinary high resolution image at atom level. However, AFM obtains the sample topography image through scanning on the top of sample line by line, therefore it takes couples minutes to get an image and this negative point makes it difficult to continuously observe surface change during manipulation. In this paper, a novel approach for compressive sensing based video rate AFM imaging system is proposed. In this method, compressive sensing is used for sampling topography information of sample surface efficiently. Compressive sensing could use fewer measurements for data sensing to recovery the image through image reconstruction algorithm. This technique decreases the scanning time for AFM scanner because of fewer measurements needed. The video rate for this new approach could reach as high as 1.75 seconds per frame.

Original languageEnglish (US)
Title of host publication2011 11th IEEE International Conference on Nanotechnology, NANO 2011
Pages1056-1059
Number of pages4
DOIs
StatePublished - 2011
Event2011 11th IEEE International Conference on Nanotechnology, NANO 2011 - Portland, OR, United States
Duration: Aug 15 2011Aug 19 2011

Publication series

NameProceedings of the IEEE Conference on Nanotechnology
ISSN (Print)1944-9399
ISSN (Electronic)1944-9380

Other

Other2011 11th IEEE International Conference on Nanotechnology, NANO 2011
CountryUnited States
CityPortland, OR
Period8/15/118/19/11

Keywords

  • AFM
  • Compressive Sensing
  • Imaging
  • Video Rate

ASJC Scopus subject areas

  • Bioengineering
  • Electrical and Electronic Engineering
  • Materials Chemistry
  • Condensed Matter Physics

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