Video rate atomic force microscopy: Use of compressive scanning for nanoscale video imaging

Ning Xi, Bo Song, Ruiguo Yang, King Lai, Hongzhi Chen, Chengeng Qu, Liangliang Chen

Research output: Contribution to journalArticlepeer-review

20 Scopus citations


Atomic Force Microscopy (AFM) is a powerful instrument for studying and exploring the nanoworld [1]. AFM can obtain ultrahigh-resolution images at the subnanoscale level. However, AFM has a very significant drawback of slow imaging speed, which is due to its working principle. A conventional AFM conducts a raster scan of an entire area to generate a topography image. Therefore, the frame rate is low, making it impossible for observation of biological and physical processes that are dynamic in nature with a lifespan of a few minutes or even seconds, such as the structural change of cells, carbon nanotube shape change, and so forth [2]?[5]. In addition, for AFM-based nanomanipulations and nanomeasurement, the low frame rate makes it difficult to achieve a real-time visual guide manipulation [6], [7]. Operators usually have to wait for finishing imaging to visualize the manipulating results. Therefore, there is an increasing demand on a fast-imaging AFM system that can capture a continuous phenomenon occurring in seconds.

Original languageEnglish (US)
Article number6450167
Pages (from-to)4-8
Number of pages5
JournalIEEE Nanotechnology Magazine
Issue number1
StatePublished - 2013
Externally publishedYes

ASJC Scopus subject areas

  • Mechanical Engineering
  • Electrical and Electronic Engineering


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