TY - JOUR
T1 - Video rate atomic force microscopy
T2 - Use of compressive scanning for nanoscale video imaging
AU - Xi, Ning
AU - Song, Bo
AU - Yang, Ruiguo
AU - Lai, King
AU - Chen, Hongzhi
AU - Qu, Chengeng
AU - Chen, Liangliang
PY - 2013
Y1 - 2013
N2 - Atomic Force Microscopy (AFM) is a powerful instrument for studying and exploring the nanoworld [1]. AFM can obtain ultrahigh-resolution images at the subnanoscale level. However, AFM has a very significant drawback of slow imaging speed, which is due to its working principle. A conventional AFM conducts a raster scan of an entire area to generate a topography image. Therefore, the frame rate is low, making it impossible for observation of biological and physical processes that are dynamic in nature with a lifespan of a few minutes or even seconds, such as the structural change of cells, carbon nanotube shape change, and so forth [2]?[5]. In addition, for AFM-based nanomanipulations and nanomeasurement, the low frame rate makes it difficult to achieve a real-time visual guide manipulation [6], [7]. Operators usually have to wait for finishing imaging to visualize the manipulating results. Therefore, there is an increasing demand on a fast-imaging AFM system that can capture a continuous phenomenon occurring in seconds.
AB - Atomic Force Microscopy (AFM) is a powerful instrument for studying and exploring the nanoworld [1]. AFM can obtain ultrahigh-resolution images at the subnanoscale level. However, AFM has a very significant drawback of slow imaging speed, which is due to its working principle. A conventional AFM conducts a raster scan of an entire area to generate a topography image. Therefore, the frame rate is low, making it impossible for observation of biological and physical processes that are dynamic in nature with a lifespan of a few minutes or even seconds, such as the structural change of cells, carbon nanotube shape change, and so forth [2]?[5]. In addition, for AFM-based nanomanipulations and nanomeasurement, the low frame rate makes it difficult to achieve a real-time visual guide manipulation [6], [7]. Operators usually have to wait for finishing imaging to visualize the manipulating results. Therefore, there is an increasing demand on a fast-imaging AFM system that can capture a continuous phenomenon occurring in seconds.
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U2 - 10.1109/MNANO.2013.2237711
DO - 10.1109/MNANO.2013.2237711
M3 - Article
AN - SCOPUS:84875725441
SN - 1932-4510
VL - 7
SP - 4
EP - 8
JO - IEEE Nanotechnology Magazine
JF - IEEE Nanotechnology Magazine
IS - 1
M1 - 6450167
ER -