Viscoelastic property mapping with contact resonance force microscopy

J. P. Killgore; D. G. Yablon; A. H. Tsou; A. Gannepalli; P. A. Yuya; J. A. Turner; R. Proksch; D. C. Hurley

doi:10.1021/la203434w

Viscoelastic property mapping with contact resonance force microscopy

J. P. Killgore, D. G. Yablon, A. H. Tsou, A. Gannepalli, P. A. Yuya, J. A. Turner, R. Proksch, D. C. Hurley

Mechanical & Materials Engineering

Research output: Contribution to journal › Article › peer-review

143 Scopus citations

Abstract

We demonstrate the accurate nanoscale mapping of near-surface loss and storage moduli on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). These viscoelastic properties are extracted from spatially resolved maps of the contact resonance frequency and quality factor of the AFM cantilever. We consider two methods of data acquisition: (i) discrete stepping between mapping points and (ii) continuous scanning. For point mapping and low-speed scanning, the values of the relative loss and storage modulus are in good agreement with the time-temperature superposition of low-frequency dynamic mechanical analysis measurements to the high frequencies probed by CR-FM.

Original language	English (US)
Pages (from-to)	13983-13987
Number of pages	5
Journal	Langmuir
Volume	27
Issue number	23
DOIs	https://doi.org/10.1021/la203434w
State	Published - Dec 6 2011

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Surfaces and Interfaces
Spectroscopy
Electrochemistry

Access to Document

10.1021/la203434w

Cite this

@article{f99bbcbc0f2240b0a90ee907878c697a,

title = "Viscoelastic property mapping with contact resonance force microscopy",

abstract = "We demonstrate the accurate nanoscale mapping of near-surface loss and storage moduli on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). These viscoelastic properties are extracted from spatially resolved maps of the contact resonance frequency and quality factor of the AFM cantilever. We consider two methods of data acquisition: (i) discrete stepping between mapping points and (ii) continuous scanning. For point mapping and low-speed scanning, the values of the relative loss and storage modulus are in good agreement with the time-temperature superposition of low-frequency dynamic mechanical analysis measurements to the high frequencies probed by CR-FM.",

author = "Killgore, {J. P.} and Yablon, {D. G.} and Tsou, {A. H.} and A. Gannepalli and Yuya, {P. A.} and Turner, {J. A.} and R. Proksch and Hurley, {D. C.}",

year = "2011",

month = dec,

day = "6",

doi = "10.1021/la203434w",

language = "English (US)",

volume = "27",

pages = "13983--13987",

journal = "Langmuir",

issn = "0743-7463",

publisher = "American Chemical Society",

number = "23",

}

TY - JOUR

T1 - Viscoelastic property mapping with contact resonance force microscopy

AU - Killgore, J. P.

AU - Yablon, D. G.

AU - Tsou, A. H.

AU - Gannepalli, A.

AU - Yuya, P. A.

AU - Turner, J. A.

AU - Proksch, R.

AU - Hurley, D. C.

PY - 2011/12/6

Y1 - 2011/12/6

N2 - We demonstrate the accurate nanoscale mapping of near-surface loss and storage moduli on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). These viscoelastic properties are extracted from spatially resolved maps of the contact resonance frequency and quality factor of the AFM cantilever. We consider two methods of data acquisition: (i) discrete stepping between mapping points and (ii) continuous scanning. For point mapping and low-speed scanning, the values of the relative loss and storage modulus are in good agreement with the time-temperature superposition of low-frequency dynamic mechanical analysis measurements to the high frequencies probed by CR-FM.

AB - We demonstrate the accurate nanoscale mapping of near-surface loss and storage moduli on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). These viscoelastic properties are extracted from spatially resolved maps of the contact resonance frequency and quality factor of the AFM cantilever. We consider two methods of data acquisition: (i) discrete stepping between mapping points and (ii) continuous scanning. For point mapping and low-speed scanning, the values of the relative loss and storage modulus are in good agreement with the time-temperature superposition of low-frequency dynamic mechanical analysis measurements to the high frequencies probed by CR-FM.

UR - http://www.scopus.com/inward/record.url?scp=82455191681&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=82455191681&partnerID=8YFLogxK

U2 - 10.1021/la203434w

DO - 10.1021/la203434w

M3 - Article

C2 - 22054300

AN - SCOPUS:82455191681

SN - 0743-7463

VL - 27

SP - 13983

EP - 13987

JO - Langmuir

JF - Langmuir

IS - 23

ER -

Viscoelastic property mapping with contact resonance force microscopy

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this