Viscoelastic property mapping with contact resonance force microscopy

J. P. Killgore, D. G. Yablon, A. H. Tsou, A. Gannepalli, P. A. Yuya, J. A. Turner, R. Proksch, D. C. Hurley

Research output: Contribution to journalArticle

120 Scopus citations

Abstract

We demonstrate the accurate nanoscale mapping of near-surface loss and storage moduli on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). These viscoelastic properties are extracted from spatially resolved maps of the contact resonance frequency and quality factor of the AFM cantilever. We consider two methods of data acquisition: (i) discrete stepping between mapping points and (ii) continuous scanning. For point mapping and low-speed scanning, the values of the relative loss and storage modulus are in good agreement with the time-temperature superposition of low-frequency dynamic mechanical analysis measurements to the high frequencies probed by CR-FM.

Original languageEnglish (US)
Pages (from-to)13983-13987
Number of pages5
JournalLangmuir
Volume27
Issue number23
DOIs
StatePublished - Dec 6 2011

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Spectroscopy
  • Electrochemistry

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    Killgore, J. P., Yablon, D. G., Tsou, A. H., Gannepalli, A., Yuya, P. A., Turner, J. A., Proksch, R., & Hurley, D. C. (2011). Viscoelastic property mapping with contact resonance force microscopy. Langmuir, 27(23), 13983-13987. https://doi.org/10.1021/la203434w