Wavelength dependent propagation loss characteristics of SiGe/Si planar waveguides

B. L. Weiss, Z. Yang, F. Namavar

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

The propagation loss of Si0.9 Ge0.1/Si planar optical waveguides has been measured at wavelengths of 1.15 and 1.523µm. The results show that these waveguides have a low propagation loss (<ldB/cm) at a wavelength of 1.523µm, which is due to the intrinsic absorption of SiGe whereas at a wavelength of 1.15µm its loss is determined by both the SiGe absorption edge and defects at the SiGe/Si interface.

Original languageEnglish (US)
Pages (from-to)2218-2220
Number of pages3
JournalElectronics Letters
Volume28
Issue number24
DOIs
StatePublished - Nov 1992
Externally publishedYes

Keywords

  • Optical waveguides
  • Optoelectronics
  • Semiconductors

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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