X-RAY PHOTOELECTRON AND AUGER SPECTRA OF AS-DEPOSITED AND ANNEALED R. F. AND I. B. DEPOSITED CARBON FILMS.

David Liu, Rodney O. Dillon, John A. Woollam

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	293-294
Number of pages	2
Journal	Extended Abstracts and Program - Biennial Conference on Carbon
State	Published - 1983
Externally published	Yes

ASJC Scopus subject areas

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title = "X-RAY PHOTOELECTRON AND AUGER SPECTRA OF AS-DEPOSITED AND ANNEALED R. F. AND I. B. DEPOSITED CARBON FILMS.",

author = "David Liu and Dillon, {Rodney O.} and Woollam, {John A.}",

year = "1983",

language = "English (US)",

pages = "293--294",

journal = "Extended Abstracts and Program - Biennial Conference on Carbon",

issn = "0160-7464",

}

TY - JOUR

T1 - X-RAY PHOTOELECTRON AND AUGER SPECTRA OF AS-DEPOSITED AND ANNEALED R. F. AND I. B. DEPOSITED CARBON FILMS.

AU - Liu, David

AU - Dillon, Rodney O.

AU - Woollam, John A.

PY - 1983

Y1 - 1983

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M3 - Conference article

AN - SCOPUS:0020912163

SN - 0160-7464

SP - 293

EP - 294

JO - Extended Abstracts and Program - Biennial Conference on Carbon

JF - Extended Abstracts and Program - Biennial Conference on Carbon

ER -