XAFS at the Canadian light source

D. T. Jiang, N. Chen, L. Zhang, K. Malgorzata, G. Wright, R. Igarashi, D. Beauregard, M. Kirkham, M. McKibben

Research output: Chapter in Book/Report/Conference proceedingConference contribution

16 Scopus citations


Canadian Light Source Hard X-ray Micro-Analysis Beamline (HXMA, 06ID-1) is a hard X-ray spectroscopy beamline currently under commissioning. The source of the beamline is a superconducting wiggler covering 5 to 40 keV. The primary optics include a cryogenically cooled double crystal monochromator (Si 111 and 220), white beam vertical collimating and toroidal focusing mirrors. End station experimental capabilities include XAFS (Ge solid state detectors), microprobe (Kirkpatrick-Baez murors, Ge solid state detector and image plate area detector), and diffraction (Huber psi-8 and powder diffraction setups, with diamond anvil cell high pressure sample environment). Commissioning status for the XAFS capabilities is described.

Original languageEnglish (US)
Title of host publicationX-RAY ABSORPTION FINE STRUCTURE - XAFS13
Subtitle of host publication13th International Conference
Number of pages3
StatePublished - 2007
Externally publishedYes
EventX-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference - Stanford, CA, United States
Duration: Jul 9 2006Jul 14 2006

Publication series

NameAIP Conference Proceedings
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616


OtherX-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference
Country/TerritoryUnited States
CityStanford, CA


  • Beamline
  • Diffraction
  • Microprobe
  • Synchrotron
  • XAFS

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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